3 edition of Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems found in the catalog.
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
James E. Potzick
by U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O. in Gaithersburg, MD, Washington
Written in English
|Other titles||Antireflecting chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems|
|Statement||James E. Potzick.|
|Series||NIST special publication -- 260-129, Standard reference materials, NIST special publication -- 260-129., Standard reference materials|
|Contributions||National Institute of Standards and Technology (U.S.)|
|The Physical Object|
|Pagination||xiii, 23 p.|
|Number of Pages||23|
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